TECHNOLOGIES

Technologies of CIT


Introducing CIT's innovative technologies.

Atomic Sputtering Epitaxy (ASE)


ASE deposition is a technology that builds up atoms layer by layer. 


This technology is based on the RF sputter method. Electrical and mechanical vibrations are blocked externally, and single crystal targets are used internally to allow atoms to be stacked on the substrate one layer at a time. 


Using this technology, it is possible to produce high-quality copper thin films on various substrates including PTFE, sapphire, and glass.

Atomic Sputtering Epitaxy (ASE)

ASE deposition is a technology that builds up atoms layer by layer. 


This technology is based on the RF sputter method. Electrical and mechanical vibrations are blocked externally, and single crystal targets are used internally to allow atoms to be stacked on the substrate one layer at a time.


Using this technology, it is possible to produce high-quality copper thin films on various substrates including PTFE, sapphire, and glass.


Technical paper

Coherent consolidation of trillions of nucleations for mono-atom step-level flat surfaces

2023-12-11

Constructingamono-atomstep-levelultra-flatmaterialsurfaceis challenging, especially for thin films, because it is prohibitively difficult for trillions of clusterstocoherentlymerge.Eventhougha roughmetalsurface, as well as the scattering of carriers at grain boundaries, limits electron transport and obscures their intrinsic properties, the importance of the flat surface has not been emphasised sufficiently. In this study, we describe in detail the initial growth of copper thin films required for mono-atom step-level flat surfaces (MSFSs). 

Deposition using atomic sputtering epitaxy leads to the coherent merging of trillions of islands into a coplanar layer, eventually forming an MSFS, for which the key factor is suggested to be the individual deposition of single atoms. 

Theoretical calculations support that single sputtered atoms ensure the formation of highly aligned nanodroplets and help them to merge 

into a coplanar layer. The realisation of the ultra-flat surfaces is expected to greatly assist efforts to improve quantum behaviour by increasing the coherency of electrons



Coherent consolidation process for a mono-atom step-level flat surface. 

a Cross-sectional bright-field scanning transmission electron microscopy (BF STEM) images. b Corresponding illustrations. The island of twenty-five Cu layers (yellow dotted line in a, formed in the initial growth stage, is maintained and grows laterally.

c Topographic atomic force microscopy images acquired from samples of five different thicknesses, corresponding to initial deposition times of 15, 30, 45, 60 and 120 s. d Cross-sectional high-resolution scanning transmission electron microscopy (HRTEM) image of the 12-nm-thick single-crystal Cu film showing mono-atom step-level flat surfaces (MSFS) with a root-mean-square (RMS) roughness

of ~0.2 nm. e Schematic side view of MSFS in d.